An iterative calibration method for improving absolute measurement accuracy of stereo deflectometry (2021)
Attributed to:
Next Generation Metrology Driven by Nanophotonics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85109211891
Type: Other
Parent Publication: Proceedings of the 21st International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2021