Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage (2017)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/asicon.2017.8252564
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85044774908
Type: Conference/Paper/Proceeding/Abstract