An enhanced modulated waveform measurement system for characterization of microwave devices under complex modulated excitations (2012)

First Author: Akmal M.

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/84867035640

Type: Journal Article/Review

Volume: 7

Parent Publication: International Journal of Microwave and Optical Technology

Issue: 3

ISSN: 15530396