Intelligent quality monitoring for additive manufactured surfaces by machine learning and light scattering (2021)

First Author: Liu M

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.2592554

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85109420030

Type: Conference/Paper/Proceeding/Abstract