A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing (2023)
Attributed to:
EPSRC NetworkPlus In Digitalised Surface Manufacturing: Towards "World's Best" Processes
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.3390/s23115326
PubMed Identifier: 37300053
Publication URI: http://europepmc.org/abstract/MED/37300053
Type: Journal Article/Review
Parent Publication: Sensors
Issue: 11
ISSN: 1424-8220