Fast Twist Angle Mapping of Bilayer Graphene Using Spectroscopic Ellipsometric Contrast Microscopy (2023)
Attributed to:
Expanding the Environmental Frontiers of Operando Metrology for Advanced Device Materials Development
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acs.nanolett.3c00619
Publication URI: http://dx.doi.org/10.1021/acs.nanolett.3c00619
Type: Journal Article/Review
Parent Publication: Nano Letters
Issue: 12