Portable multiscale form measurement technique for structured specular surfaces based on phase measuring deflectometry (2023)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/s44267-023-00017-8

Publication URI: http://dx.doi.org/10.1007/s44267-023-00017-8

Type: Journal Article/Review

Parent Publication: Visual Intelligence

Issue: 1