Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction. (2023)
Attributed to:
Monolithic On-chip Integration of Electronics & Photonics Using III-nitrides for Telecoms
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1093/micmic/ozad118
PubMed Identifier: 37947075
Publication URI: http://europepmc.org/abstract/MED/37947075
Type: Journal Article/Review
Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
ISSN: 1431-9276