Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction (2020)

First Author: Berenguer F
Attributed to:  InAsNSb Dilute Nitride Materials for Mid-infrared Devices & Applications funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1038/s43246-020-0021-6

Publication URI: http://dx.doi.org/10.1038/s43246-020-0021-6

Type: Journal Article/Review

Parent Publication: Communications Materials

Issue: 1