Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films (2022)
Attributed to:
Enabling microfocus & thin film X-ray scattering at the University of Southampton
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1117/1.oe.61.7.071603
Publication URI: http://dx.doi.org/10.1117/1.oe.61.7.071603
Type: Journal Article/Review
Parent Publication: Optical Engineering
Issue: 07
ISSN: 0091-3286