Thickness Measurement of Circular Metallic Film Using Single-Frequency Eddy Current Sensor (2021)

First Author: Lu M

Attributed to: Real-time In-line Microstructural Engineering (RIME) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.20944/preprints202102.0237.v1

Publication URI: http://dx.doi.org/10.20944/preprints202102.0237.v1

Type: Preprint