In Situ Sputtering From the Micromanipulator to Enable Cryogenic Preparation of Specimens for Atom Probe Tomography by Focused-Ion Beam (2023)
Attributed to:
A Facility for Cryo-Enabled Multi-microscopy for Nanoscale Analysis in the Engineering and Physical Sciences (Cryo-EPS)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1093/micmic/ozad020
Publication URI: http://dx.doi.org/10.1093/micmic/ozad020
Type: Journal Article/Review
Parent Publication: Microscopy and Microanalysis
Issue: 3