Investigation on Single and Split Output Gate Configurations Influence on the GaN-HEMTs Switching Behaviours (2023)
Attributed to:
Gallium Nitride Smart Power Integrated Circuit Technology (GaN SPICe)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.23919/epe23ecceeurope58414.2023.10264283
Publication URI: http://dx.doi.org/10.23919/epe23ecceeurope58414.2023.10264283
Type: Conference/Paper/Proceeding/Abstract