Direct visualization of chemical transport in solid-state chemical reactions by time-of-flight secondary ion mass spectrometry (2024)
Attributed to:
Nanoscale photophysics at defects and interfaces in organic semiconductors
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.26434/chemrxiv-2024-whvl8
Publication URI: http://dx.doi.org/10.26434/chemrxiv-2024-whvl8
Type: Preprint