A study of defect evolution in multi-energy helium implanted monocrystalline and polycrystalline silicon (2009)
Attributed to:
In-Situ TEM Studies of Ion-Irradiated Materials
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/pssc.200881452
Publication URI: http://dx.doi.org/10.1002/pssc.200881452
Type: Journal Article/Review
Parent Publication: physica status solidi c
Issue: 8
ISSN: 18626351