Simultaneous Fault Models for the Generation of Efficient Error Detection Mechanisms (2017)
Attributed to:
The Alan Turing Institute
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/issre.2017.29
Publication URI: http://dx.doi.org/10.1109/issre.2017.29
Type: Conference/Paper/Proceeding/Abstract
ISSN: 10719458