Stereo stitching deflectometry for measurement of specular surface with enlarged aperture (2022)
Attributed to:
Next Generation Metrology Driven by Nanophotonics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Type: Other
Parent Publication: European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 22nd International Conference and Exhibition, EUSPEN 2022