Detection Sensitivity Limit of Hundreds of Atoms with X-Ray Fluorescence Microscopy (2023)
Attributed to:
Route to high-precision positioning of single ion-implanted impurities in silicon
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2310.03409
Publication URI: https://arxiv.org/abs/2310.03409
Type: Preprint