Simultaneous microscopic imaging of thickness and refractive index of thin layers by heterodyne interferometric reflectometry (HiRef) (2021)

First Author: Nahmad-Rohen A

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2106.06698

Publication URI: https://arxiv.org/abs/2106.06698

Type: Preprint