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A Stein Goodness of fit Test for Exponential Random Graph Models (2021)

First Author: Xu W

Attributed to: Application driven Topological Data Analysis funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2103.00580

Publication URI: https://arxiv.org/abs/2103.00580

Type: Other