Disorder-induced electron and hole trapping in amorphous TiO2 (2020)
Attributed to:
Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2007.09165
Publication URI: https://arxiv.org/abs/2007.09165
Type: Other