Characterisation of negative-U defects in semiconductors (2020)
Attributed to:
SuperSilicon PV: extending the limits of material performance
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2005.06447
Publication URI: https://arxiv.org/abs/2005.06447
Type: Other