Effects of nitridation on SiC/SiO$_2$ structures studied by hard X-ray photoelectron spectroscopy (2019)
Attributed to:
Understanding the critical role of interfaces and surfaces in energy materials
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1912.06592
Publication URI: https://arxiv.org/abs/1912.06592
Type: Preprint