Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling Microscopy (2019)
Attributed to:
Atomically Deterministic Doping and Readout For Semiconductor Solotronics (ADDRFSS)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1910.06685
Publication URI: https://arxiv.org/abs/1910.06685
Type: Preprint