Metrology of Complex Refractive Index for Solids in the Terahertz Regime Using Frequency Domain Spectroscopy (2018)
Attributed to:
Atomically Deterministic Doping and Readout For Semiconductor Solotronics (ADDRFSS)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1805.03590
Publication URI: https://arxiv.org/abs/1805.03590
Type: Other