True-to-size surface mapping with neutral helium atoms (2021)
Attributed to:
Microscopy with neutral helium atoms: A wide-ranging new technique for delicate samples
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.17863/cam.69899
Publication URI: https://www.repository.cam.ac.uk/handle/1810/322441
Type: Journal Article/Review