AlN-GeO<inf>2</inf> based gate stack for improved reliability of Ge MOSFETs (2015)
Attributed to:
High permittivity dielectrics on Ge for end of Roadmap application
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.17863/cam.40582
Publication URI: https://www.repository.cam.ac.uk/handle/1810/293430
Type: Journal Article/Review