Wafer-Scale Epitaxial Growth of the Thickness-Controllable Van Der Waals Ferromagnet CrTe 2 for Reliable Magnetic Memory Applications (2023)

First Author: Liu X

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/adfm.202304454

Publication URI: http://dx.doi.org/10.1002/adfm.202304454

Type: Journal Article/Review

Parent Publication: Advanced Functional Materials

Issue: 50

ISSN: 1616-301X