Understanding radiation-generated electronic traps in radiation dosimeters based on organic field-effect transistors (2024)
Attributed to:
XMaS: The UK Materials Science Facility at the ESRF
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1039/d3mh01507f
Publication URI: http://dx.doi.org/10.1039/d3mh01507f
Type: Journal Article/Review
Parent Publication: Materials Horizons
Issue: 1