Improving the resolution in soft X-ray emission spectrometers through photon-counting using an Electron Multiplying CCD (2012)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/7/01/c01063
Publication URI: http://dx.doi.org/10.1088/1748-0221/7/01/c01063
Type: Journal Article/Review
Parent Publication: Journal of Instrumentation
Issue: 01