High-resolution soft x-ray spectrometry using the electron-multiplying charge-coupled device (EM-CCD) (2013)

First Author: David J. Hall And James H. Tutt And Matthew R. Soman And Andrew D. Holland And Neil J. Murray And Bernd Schmitt And Thorsten Schmitt

Abstract

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Bibliographic Information

Volume: 8859

Parent Publication: Proceedings of SPIE