The Noise Performance of Electron-Multiplying Charge-Coupled Devices at Soft X-Ray Energy Values (2012)
Attributed to:
Radiation Damage Studies in CCDs and CMOS Imagers, X-ray CCDs for the XEUS Wide Field Imager and CMOS Sensor Development
funded by
STFC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2012.2200488
Publication URI: http://dx.doi.org/10.1109/ted.2012.2200488
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 8