Modelling charge storage in Euclid CCD structures (2012)
Attributed to:
Simulation and Measurement of Advanced Semiconductor Imaging Sensors
funded by
STFC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/7/01/c01058
Publication URI: http://dx.doi.org/10.1088/1748-0221/7/01/c01058
Type: Journal Article/Review
Parent Publication: Journal of Instrumentation
Issue: 01