Positron spectroscopy of high- k dielectric films on SiC (2007)
Attributed to:
Technologies for SiC electronics and sensors in extreme environments
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/pssc.200675787
Publication URI: http://dx.doi.org/10.1002/pssc.200675787
Type: Journal Article/Review
Parent Publication: physica status solidi c
Issue: 10