Calibration of RHEED patterns for the appraisal of titania surface crystallography

First Author: Tao T

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/978-3-540-85156-1_377

Publication URI: http://dx.doi.org/10.1007/978-3-540-85156-1_377

Type: Book Chapter

Book Title: EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany (2008)

Page Reference: 753-754

ISBN: 978-3-540-85154-7