Deep level transient spectroscopy study of the effect of Mn and Bi doping on trap formation in ZnO (2010)
Attributed to:
SEM-based Technique for Local Property Measurements in Electroceramic Thick/Thin Films: Proof of Principle
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1007/s10832-010-9614-7
Publication URI: http://dx.doi.org/10.1007/s10832-010-9614-7
Type: Journal Article/Review
Parent Publication: Journal of Electroceramics
Issue: 2-4