Microstructural characterization of the tool-chip interface enabled by focused ion beam and analytical electron microscopy (2009)
Attributed to:
Building New Capability in Structural Ceramics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.wear.2009.03.001
Publication URI: http://dx.doi.org/10.1016/j.wear.2009.03.001
Type: Journal Article/Review
Parent Publication: Wear
Issue: 11-12