A Combined Total Scattering and Simulation Approach to Analyzing Defect Structure in Bi 3 YO 6 (2010)

First Author: Abrahams I
Attributed to:  Characterization and optimization of new fluorite-related oxide ion conductors funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/cm101130a

Publication URI: http://dx.doi.org/10.1021/cm101130a

Type: Journal Article/Review

Parent Publication: Chemistry of Materials

Issue: 15