Atomic scale characterization of buried InxGa1-xAs quantum dots using pulsed laser atom probe tomography (2008)

First Author: Müller M
Attributed to:  An advanced 3D atom probe analysis facility funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.2918846

Publication URI: http://dx.doi.org/10.1063/1.2918846

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 23