Atomic scale characterization of buried InxGa1-xAs quantum dots using pulsed laser atom probe tomography (2008)
Attributed to:
An advanced 3D atom probe analysis facility
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.2918846
Publication URI: http://dx.doi.org/10.1063/1.2918846
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 23