Atomic-scale distortion of optically activated Sm dopants identified with site-selective X-ray absorption spectroscopy (2013)

First Author: Ishii M
Attributed to:  Silicon emission technologies based on nanocrystals funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4824375

Publication URI: http://dx.doi.org/10.1063/1.4824375

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 13