Defect identification in strained Si/SiGe heterolayers for device applications (2009)

First Author: Escobedo-Cousin E
Attributed to:  Nanometre Strain Evaluation for Future and Emerging Technologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0022-3727/42/17/175306

Publication URI: http://dx.doi.org/10.1088/0022-3727/42/17/175306

Type: Journal Article/Review

Parent Publication: Journal of Physics D: Applied Physics

Issue: 17