Atomic-resolution STEM imaging and EELS-SI of defects in BiFeO 3 ceramics co-doped with Nd and Ti (2012)
Attributed to:
Using aberration corrected STEM to study the atomic structure of incommensurate antiferroelectrics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1742-6596/371/1/012034
Publication URI: http://dx.doi.org/10.1088/1742-6596/371/1/012034
Type: Journal Article/Review
Parent Publication: Journal of Physics: Conference Series