Critical thickness for the agglomeration of thin metal films (2009)

First Author: Boragno C
Attributed to:  Exploration of Strain Fields in Crystalline Nanowires funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/physrevb.79.155443

Publication URI: http://dx.doi.org/10.1103/physrevb.79.155443

Type: Journal Article/Review

Parent Publication: Physical Review B

Issue: 15