Investigation into the impact of component floor plan layout on the overall reliability of electronics systems in harsh environments (2010)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/estc.2010.5642969
Publication URI: http://dx.doi.org/10.1109/estc.2010.5642969
Type: Conference/Paper/Proceeding/Abstract
ISBN: 978-1-4244-8553-6