Defect-Related Excess Low-Frequency Noise in Ge-on-Si pMOSFETs (2011)

First Author: Simoen E

Attributed to: Renaissance Germanium funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2010.2089968

Publication URI: http://dx.doi.org/10.1109/led.2010.2089968

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 1