Analysis of Self-Heating Effects in Ultrathin-Body SOI MOSFETs by Device Simulation (2008)

First Author: Fiegna C
Attributed to:  Platform: Strained Si / SiGe: Materials, Technology and Design funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2007.911354

Publication URI: http://dx.doi.org/10.1109/ted.2007.911354

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 1