Low-Frequency Noise Characterization of Strained Germanium pMOSFETs (2011)

First Author: Simoen E

Attributed to: Renaissance Germanium funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2011.2160679

Publication URI: http://dx.doi.org/10.1109/ted.2011.2160679

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 9