Radiation Induced Change in Defect Density in ${\hbox {HfO}}_{2}$-Based MIM Capacitors (2009)

First Author: Miao B
Attributed to:  Technologies for SiC electronics and sensors in extreme environments funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tns.2009.2015314

Publication URI: http://dx.doi.org/10.1109/tns.2009.2015314

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Nuclear Science

Issue: 5