(Invited) The Impact of Oxide Precipitates on Minority Carrier Lifetime in Czochralski Silicon (2013)
Attributed to:
Gettering of impurities in silicon: delivering quantitative understanding to improve photovoltaics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1149/05005.0137ecst
Publication URI: http://dx.doi.org/10.1149/05005.0137ecst
Type: Journal Article/Review
Parent Publication: ECS Transactions
Issue: 5