Combining near-field scanning optical microscopy with spectral interferometry for local characterization of the optical electric field in photonic structures (2013)

First Author: Trägårdh J

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/oe.21.016629

PubMed Identifier: 23938514

Publication URI: http://europepmc.org/abstract/MED/23938514

Type: Journal Article/Review

Parent Publication: Optics Express

Issue: 14

ISSN: 1094-4087